Our infrared and hyperspectral imaging solutions provide the advanced spectral sensitivity required for applications that extend beyond the capabilities of conventional vision systems. With support for SWIR (Short-Wave Infrared) and NIR (Near-Infrared) imaging, our cameras can detect features such as moisture content in crops, hidden defects in electronic components, and surface anomalies in industrial materials. Polarized imaging options add another layer of analytical power by highlighting stress patterns, surface textures, and reflections that are invisible to standard imaging. These technologies are essential in fields like precision agriculture, semiconductor inspection, medical diagnostics, and recycling, where detailed spectral and polarization data enable more accurate classification, sorting, and quality control. Designed for high sensitivity, resolution, and integration flexibility, our cameras bring cutting-edge imaging performance to the most demanding spectral applications.
Short wave infrared (SWIR) cameras are valuable tools in machine vision applications, offering unique capabilities for imaging beyond the visible spectrum. These cameras utilize sensors sensitive to wavelengths between approximately 900 and 1700 nanometers, allowing them to penetrate through haze, fog, smoke, and some materials that are opaque to visible light. In machine vision, SWIR cameras enable imaging in challenging conditions such as low light or adverse weather, making them ideal for applications such as surveillance, security, and outdoor monitoring. Additionally, SWIR cameras can detect and differentiate materials based on their spectral signatures, providing valuable information for quality control, sorting, and inspection tasks in industries such as pharmaceuticals, agriculture, and recycling. Furthermore, SWIR cameras can penetrate certain materials to reveal subsurface features or defects, making them useful for non-destructive testing and imaging through packaging materials. Overall, SWIR cameras enhance the capabilities of machine vision systems by providing versatile imaging solutions for a wide range of applications, particularly in challenging or specialized environments where traditional visible cameras may be limited. SVS-Vistek SWIR cameras incorporate Sony SenSWIR technology and the proven EXO and FXO camera platforms. Thanks to their wide spectral range and high sensitivity, SVS-Vistek SWIR cameras combine the benefits of an extremely compact footprint with a range from 400nm VIS to the SWIR range at 1700nm. With an innovative thermal design, users can have outstanding optical quality and dynamic range results, potentially using a single camera for multiple areas of the light spectrum.
Laser beam profiling is a technique used to analyze and characterize the properties of a laser beam complementary to simple power or energy measurements. It involves measuring various parameters such as spatial energy or intensity distribution, beam widths, centroid, ellipticity, and orientation. The primary goal of laser beam profiling is to obtain a comprehensive understanding of the laser beam’s characteristics, which helps in assessing its performance and optimizing its usage for specific applications.
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